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OptoTop®
High-precision 3D Profilometer
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Basic Functions
Optical
surface measuring system for non-contact
measurements of highly complex topographies and
geometries in the nano-, micro- and macro- scale.
Applications in research and development, receiving
inspection, quality control and failure analysis.
Advantages:
Easy and comfortable handling
Rapid data acquisition
Robust measuring method for various materials,
coatings and samples
Micro roughness index number for linear profile
Direction-derived roughness index number of
areas (texture-orientation analysis)
Topography as 2D-line profile, 3D-display and
height profile
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Applications
Scopes of Application:
Roughness
analysis and structure determination on flat, structured
and curved surfaces
Measuring
of macro and micro geometries, planar control
Surface
control, e.g. roll embossing (option: mobile unit)
Examples
Writing paper:
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Height
measurement |
Intensity
measurement |
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Sensor: |
Chromatic
Confocal |
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Test range
Z*: |
300µm1mm2mm |
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Resolution
Z*: |
12nm25nm75nm |
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Lateral
resolution: |
1.55µm2µm4µm |
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Measuring
distance: |
11mm12.7mm16.4mm |
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Measuring
frequency: |
30 Hz, 100
Hz, 300 Hz, 1 kHz |
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Standard
test range XY: |
60 x 60 mm |
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Velocity: |
0.1 to 10
mm/s |
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Standard
table size: |
165 x 165
mm or customized |
Innowep
OptoTop Details |
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